Wei Feng, Yinghui Quan, School of Electronic Engineering, Xidian University, China; Gabriel Dauphin, Institut Galilée, University Paris XIII, France; Xian Zhong, School of Electronic Engineering, Xidian University, China; Qiang Li, Northwestern Polytechnical University, China; Mengdao Xing, Xidian University, China; Wenjiang Huang, Chinese Academy of Sciences, China