Alessandra Budillon, Dipartimento di Igegneria Univ. of Napoli Parthenope, Italy; Loıc Denis, UJM-Saint-Etienne, CNRS, Institut d Optique Graduate School, France; Clement Rambour, LTCI, Telecom Paris, Institut Polytechnique de Paris, France; Gilda Schirinzi, Dipartimento di Igegneria Univ. of Napoli Parthenope, Italy; Florence Tupin, LTCI, Telecom Paris, Institut Polytechnique de Paris, France