Marius Vögtli, University of Zurich, Switzerland; Simon Schreiner, Fraunhofer IOSB - Institute of Optronics, System Technologies and Image Exploitation, Germany; Jonas Böhler, University of Zurich, Switzerland; Wolfgang Gross, Jannick Kuester, Jonas Mispelhorn, Fraunhofer IOSB - Institute of Optronics, System Technologies and Image Exploitation, Germany; Andreas Hueni, University of Zurich, Switzerland; Wolfgang Middelmann, Fraunhofer IOSB - Institute of Optronics, System Technologies and Image Exploitation, Germany; Mathias Kneubühler, University of Zurich, Switzerland